 |
 |
Sub-nanometer
vertical resolution (down to 0.1 nm) at all magnifications |
|
|
|
Non-contact
measurements allowing accurate and repeatable results |
|
|
|
Manual
stitching / Manual turret |
|
|
|
Easy
to use |
|
|
|
Sub-nanometric
roughness measurements |
|
|
|
Compact |
|
|
| |
For
more information download the data
sheet |
