Vacuumbox


Vacuum device static & dynamic characterisation for M(O)EMS and material testing


VACUUM BOX & MIRAU INTERFEROMETRIC OBJECTIVES

Stroboscopic interferometric microscopy combined with vacuum box is the perfect tool for MEMS testing, mechanical measurements
(quality factor, rising/falling time), and MEMS behaviour testing
(reliability) under temperature.



Main advantage of Fogale Vacuum box
Device characterization under controlled environmental contitions:
- Vacuum
- Gaz partial pressure
- Temperature
User-customizable I/O ports
Easy sample handling (PLCC 68 pin or user configurable)



Fogale developped specific glass-compensated, long-working
distance, interferometric objectives for 3D mode shape
measurement across the vacuum box glass plate:
- Vacuum Box
MEMS Solution : High performance software for In-plane and out-of-plane dynamic measurement

Vacuum box and long working distance objectives are available as an option suitable for the Photomap and Zoomsurf 3D systems, enabling dynamic measurements under vacuum using the MEMS solution functions.