|
 |
Sub-nanometer
vertical resolution (down to 0.1 nm) at all magnifications |
|
|
|
Non-contact
measurements allowing accurate and repeatable results |
|
|
|
All
axes motorization enabling automatic stitching of multiples fields
of view |
|
|
|
Automated
measurement sequence |
|
|
|
Sub-nanometric
roughness measurements |
|
|
|
Easy
to use and production-ready |
|
|
|
Automated
step height and surface flattening functions |
|
|
| |
For
more information download the data
sheet |
