Articles for download 
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Courteville
A., Wilhelm R., Delaveau M., Garcia F.
"Non-contact in-process metrology using a high accuracy low
coherence interferometer"
Laser Metrology and Machine Performance VII, 7th International
Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic
Performance Lamdamap 2005, pp. 534 — 544, 2005.
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Wilhelm
R., Courteville A.
"Dimensional metrology for the fabrication of imaging optics
using a high accuracy low coherence interferometer"
Optical Measurement Systems for Industrial Inspection, Proceedings
of SPIE 5856, 2005.
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Courteville
A., Wilhelm R.
"Contact-free on-axis metrology for the fabrication and testing
of complex optical systems"
Optical Fabrication, Testing, and Metrology II, Proceedings of
SPIE 5965, 2005.
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Wilhelm
R., Courteville A., Garcia F.
"A novel, low coherence fibre optic interferometer for position
and thickness measurements with unattained accuracy"
Optical Sensing II, Proceedings of SPIE 6189, 2006.
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